I. Overview of functional and structural features         

Basic functions: ST2571-F01 tungsten probe rectangular four probe test probe, rectangular 1 * 1mm needle pitch, high wear-resistant tungsten carbide probe, four probe instrument and test bench, used to test the resistivity and square resistance of silicon wafer, silicon block, solar silicon wafer and other materials.

Basic composition: the complete set of probes consists of removable tungsten carbide probes, probe clamping units, probes and probe pressure buffer springs, hand-held jackets, test bench connection units, instrument connecting cables and other components.

Matching and compatibility: This probe is compatible with all four probe instruments and four probe test benches of our company. The main models in the table below are compatible with our test benches and four probe instruments of most other manufacturers.

List of models and names of applicable products of ST2571-F01 tungsten probe rectangular four probe

 II. Main Technical Parameters and Description            

1.  It can measure sheet, block or bar. Minimum sample size 2mm × 2mm, the maximum plane size and thickness are determined by the equipped test bench, and the hand-held probe mode is not limited.

1.1 Probe spacing: rectangular 1 * 1mm needle spacing.

1.2 Mechanical displacement rate of probe: ± 0.5%.

1.3 Probe: tungsten carbide, Φ 0.5mm。

1.4 Pressure: 0~1000g adjustable, and the rated pressure is about 600g.

2.  The probe can be quickly disassembled and replaced, which is convenient for the production line to use frequently.

 III. Usage                                                                         

Please refer to the use mode of each supporting test bench

 IV. Contact Information and Purchase Channel            

Sales Manager: Grace Zheng

Tel.:+8618762109211

Email: zhengjingjing@szjgdz888.com

Alibaba Store: https://szjgdz.en.alibaba.com